Variable sampling in multiparameter Shewhart charts

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dc.contributor.authorChengalur-Smith, Indushobha Narayananen
dc.contributor.committeecochairArnold, Jesse C.en
dc.contributor.committeecochairReynolds, Marion Jr.en
dc.contributor.committeememberHinkelmann, Klausen
dc.contributor.committeememberHoltzman, Goldeen
dc.contributor.committeememberMyers, Raymonden
dc.contributor.departmentStatisticsen
dc.date.accessioned2015-07-28T19:21:19Zen
dc.date.available2015-07-28T19:21:19Zen
dc.date.issued1989en
dc.description.abstractThis dissertation deals with the use of Shewhart control charts, modified to have variable sampling intervals, to simultaneously monitor a set of parameters. Fixed sampling interval control charts are modified to utilize sampling intervals that vary depending on what is being observed from the data. Two problems are emphasized, namely, the simultaneous monitoring of the mean and the variance and the simultaneous monitoring of several means. For each problem, two basic strategies are investigated. One strategy uses separate control charts for each parameter. A second strategy uses a single statistic which combines the information in the entire sample and is sensitive to shifts in any of the parameters. Several variations on these two basic strategies are studied. Numerical studies investigate the optimal number of sampling intervals and the length of the sampling intervals to be used. Each procedure is compared to corresponding fixed interval procedures in terms of time and the number of samples taken to signal. The effect of correlation on multiple means charts is studied through simulation. For both problems, it is seen that the variable sampling interval approach is substantially more efficient than fixed interval procedures, no matter which strategy is used.en
dc.description.degreePh. D.en
dc.format.extentxi, 128 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/54782en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 20439585en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V856 1989.C5374en
dc.subject.lcshRepetitive manufacturing systems -- Researchen
dc.subject.lcshVariational inequalities (Mathematics)en
dc.subject.lcshVariational principlesen
dc.titleVariable sampling in multiparameter Shewhart chartsen
dc.typeDissertationen
dc.type.dcmitypeTexten
thesis.degree.disciplineStatisticsen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.leveldoctoralen
thesis.degree.namePh. D.en

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