Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model
dc.contributor.author | Lu, Albert | en |
dc.contributor.author | Marshall, Jordan | en |
dc.contributor.author | Wang, Yifan | en |
dc.contributor.author | Xiao, Ming | en |
dc.contributor.author | Zhang, Yuhao | en |
dc.contributor.author | Wong, Hiu Yung | en |
dc.date.accessioned | 2023-05-02T19:08:46Z | en |
dc.date.available | 2023-05-02T19:08:46Z | en |
dc.date.issued | 2022-12 | en |
dc.description.abstract | In this paper, two methodologies are used to speed up the maximization of the breakdown voltage (BV) of a vertical GaN diode that has a theoretical maximum BV of -2100 V. Firstly, we demonstrated a 5X faster accurate simulation method in Technology Computer-Aided-Design (TCAD). This allows us to find 50 % more numbers of high BV (>1400 V) designs at a given simulation time. Secondly, a machine learning (ML) model is developed using TCAD-generated data and used as a surrogate model for differential evolution optimization. It can inversely design an out-of-the-training-range structure with BV as high as 1887 V (89 % of the ideal case) compared to -1100 V designed with human domain expertise. | en |
dc.description.notes | Acknowledgment This material is based upon work supported by the National Science Foundation under Grant No. ECCS-2134374. | en |
dc.description.sponsorship | National Science Foundation; [ECCS-2134374] | en |
dc.description.version | Published version | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.doi | https://doi.org/10.1016/j.sse.2022.108468 | en |
dc.identifier.eissn | 1879-2405 | en |
dc.identifier.other | 108468 | en |
dc.identifier.uri | http://hdl.handle.net/10919/114896 | en |
dc.identifier.volume | 198 | en |
dc.language.iso | en | en |
dc.publisher | Pergamon-Elsevier Science | en |
dc.rights | Creative Commons Attribution 4.0 International | en |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en |
dc.subject | Power electronics | en |
dc.subject | Power device | en |
dc.subject | Breakdown voltage | en |
dc.subject | Differential evolution | en |
dc.subject | Gallium nitride (GaN) | en |
dc.subject | Machine learning | en |
dc.subject | Technology Computer-Aided Design (TCAD) | en |
dc.subject | Diode | en |
dc.title | Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model | en |
dc.title.serial | Solid-State Electronics | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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