Self-assembled NaNbO3-Nb2O5 (ferroelectric-semiconductor) heterostructures grown on LaAlO3 substrates
dc.contributor | Virginia Tech | en |
dc.contributor.author | Wang, Zhiguang | en |
dc.contributor.author | Li, Yanxi | en |
dc.contributor.author | Chen, Bo | en |
dc.contributor.author | Viswan, Ravindranath | en |
dc.contributor.author | Li, Jiefang | en |
dc.contributor.author | Viehland, Dwight D. | en |
dc.contributor.department | Center for Energy Harvesting Materials and Systems (CEHMS) | en |
dc.contributor.department | Materials Science and Engineering | en |
dc.date.accessed | 2014-01-10 | en |
dc.date.accessioned | 2014-01-21T19:28:07Z | en |
dc.date.available | 2014-01-21T19:28:07Z | en |
dc.date.issued | 2012-09-01 | en |
dc.description.abstract | We deposited NaNbO3 (NNO)-Nb2O5 (NO) self-assembled heterostructures on LaAlO3 (LAO) to form ferroelectric-semiconductor vertically integrated nanostructures. The NNO component formed as nanorods embedded in a NO matrix. X-ray diffraction confirmed epitaxial growth of both NNO and NO phases. Phase distribution was detected by scanning electron microscopy. The NNO/NO volume ratio was strongly dependent on the deposition temperature due to the volatility of sodium. Piezoelectric force microscopy revealed a good piezoelectric response in the NNO component with a piezoelectric coefficient of D-33 approximate to 12 pm/V, with SrRuO3 (SRO) acting as bottom electrode. The current-voltage characterization of NNO-NO/SRO-LAO showed a typical diode rectifying behavior. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4754713] | en |
dc.description.sponsorship | U.S. Department of Energy DE-AC02-98CH10886 | en |
dc.description.sponsorship | Office of the Air-Force Office of Scientific Research FA9550-09-1-0552 | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Wang, Zhiguang; Li, Yanxi; Chen, Bo; et al., "Self-assembled NaNbO3-Nb2O5 (ferroelectric-semiconductor) heterostructures grown on LaAlO3 substrates," Appl. Phys. Lett. 101, 132902 (2012); http://dx.doi.org/10.1063/1.4754713 | en |
dc.identifier.doi | https://doi.org/10.1063/1.4754713 | en |
dc.identifier.issn | 0003-6951 | en |
dc.identifier.uri | http://hdl.handle.net/10919/24948 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/101/13/10.1063/1.4754713 | en |
dc.language.iso | en_US | en |
dc.publisher | AIP Publishing | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Thin films | en |
dc.subject | Nanostructures | en |
dc.subject | Strain | en |
dc.subject | Physics | en |
dc.title | Self-assembled NaNbO3-Nb2O5 (ferroelectric-semiconductor) heterostructures grown on LaAlO3 substrates | en |
dc.title.serial | Applied Physics Letters | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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