Rigid registration algorithm based on the minimization of the total variation of the difference map

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dc.contributor.authorXiao, Xianghuien
dc.contributor.authorXu, Zhengruien
dc.contributor.authorHou, Dongen
dc.contributor.authorYang, Zhijieen
dc.contributor.authorLin, Fengen
dc.date.accessioned2022-11-03T19:32:01Zen
dc.date.available2022-11-03T19:32:01Zen
dc.date.issued2022-07en
dc.description.abstractImage registration is broadly used in various scenarios in which similar scenes in different images are to be aligned. However, image registration becomes challenging when the contrasts and backgrounds in the images are vastly different. This work proposes using the total variation of the difference map between two images (TVDM) as a dissimilarity metric in rigid registration. A method based on TVDM minimization is implemented for image rigid registration. The method is tested with both synthesized and real experimental data that have various noise and background conditions. The performance of the proposed method is compared with the results of other rigid registration methods. It is demonstrated that the proposed method is highly accurate and robust and outperforms other methods in all of the tests. The new algorithm provides a robust option for image registrations that are critical to many nanoscale X-ray imaging and microscopy applications.en
dc.description.notesThis research used resources of the beamline FXI/18ID of the National Synchrotron Light Source II, a US Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. The work at Virginia Tech was supported by the National Science Foundation under contract DMR 1832613.en
dc.description.sponsorshipDOE Office of Science by Brookhaven National Laboratory [DE-SC0012704]; National Science Foundation [DMR 1832613]en
dc.description.versionPublished versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.doihttps://doi.org/10.1107/S1600577522005598en
dc.identifier.eissn1600-5775en
dc.identifier.issn0909-0495en
dc.identifier.pmid35787576en
dc.identifier.urihttp://hdl.handle.net/10919/112374en
dc.identifier.volume29en
dc.language.isoenen
dc.publisherInternational Union of Crystallographyen
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectdifference mapen
dc.subjectimage registrationen
dc.subjecttotal variationen
dc.subjectX-ray microscopyen
dc.subjectTXM-XANESen
dc.titleRigid registration algorithm based on the minimization of the total variation of the difference mapen
dc.title.serialJournal of Synchrotron Radiationen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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