Measurements of GaN Application to Avoid Influences of Parasitic Components

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dc.contributor.authorLai, Jihen
dc.date.accessioned2024-03-06T18:43:20Zen
dc.date.available2024-03-06T18:43:20Zen
dc.date.issued2023-09-04en
dc.description.versionUnpublished versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.orcidLai, Jih [0000-0003-2315-8460]en
dc.identifier.urihttps://hdl.handle.net/10919/118286en
dc.language.isoenen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleMeasurements of GaN Application to Avoid Influences of Parasitic Componentsen
dc.typePresentationen
dc.type.dcmitypeTexten
dc.type.otherOral Presentationen
dc.type.otherWorkshopen
pubs.organisational-group/Virginia Techen
pubs.organisational-group/Virginia Tech/Engineeringen
pubs.organisational-group/Virginia Tech/Engineering/Electrical and Computer Engineeringen
pubs.organisational-group/Virginia Tech/All T&R Facultyen
pubs.organisational-group/Virginia Tech/Engineering/COE T&R Facultyen

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