Broadening of x‐ray diffraction lines from small subgrains containing gradients of spacing

TR Number
Date
1978
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics
Abstract

Recent data on subgrain size and spacing gradients in the Cu‐Ni system allow a more critical examination of a technique currently used to obtain the composition profiles of small diffusion zones. These data support the assumption that the broadening from individual subgrains need not include a spacing gradient term when volume diffusion is predominant. However, care should be taken in the interpretation of the earliest stage of diffusion where grain boundaries,surface, and other defects may introduce large spacing gradients.

Description
Keywords
Diffusion, Grain boundaries, Surface boundary
Citation
Houska, C. R. (1978). Broadening of x‐ray diffraction lines from small subgrains containing gradients of spacing. Journal of Applied Physics, 49(5), 2991-2993. doi: 10.1063/1.325147