Broadening of x‐ray diffraction lines from small subgrains containing gradients of spacing

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dc.contributorVirginia Tech. Department of Materials Engineeringen
dc.contributor.authorHouska, Charles R.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2015-04-24en
dc.date.accessioned2015-05-21T19:47:31Zen
dc.date.available2015-05-21T19:47:31Zen
dc.date.issued1978en
dc.description.abstractRecent data on subgrain size and spacing gradients in the Cu‐Ni system allow a more critical examination of a technique currently used to obtain the composition profiles of small diffusion zones. These data support the assumption that the broadening from individual subgrains need not include a spacing gradient term when volume diffusion is predominant. However, care should be taken in the interpretation of the earliest stage of diffusion where grain boundaries,surface, and other defects may introduce large spacing gradients.en
dc.description.sponsorshipNational Science Foundation (U.S.)en
dc.format.extent4 pagesen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHouska, C. R. (1978). Broadening of x‐ray diffraction lines from small subgrains containing gradients of spacing. Journal of Applied Physics, 49(5), 2991-2993. doi: 10.1063/1.325147en
dc.identifier.doihttps://doi.org/10.1063/1.325147en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52483en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/49/5/10.1063/1.325147en
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectDiffusionen
dc.subjectGrain boundariesen
dc.subjectSurface boundaryen
dc.titleBroadening of x‐ray diffraction lines from small subgrains containing gradients of spacingen
dc.title.serialJournal of Applied Physicsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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