VTechWorks staff will be away for the winter holidays starting Tuesday, December 24, 2024, through Wednesday, January 1, 2025, and will not be replying to requests during this time. Thank you for your patience, and happy holidays!
 

Nonparametric Bayes multiresolution testing for high-dimensional rare events

TR Number

Date

2024-01

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

In a variety of application areas, there is interest in assessing evidence of differences in the intensity of event realizations between groups. For example, in cancer genomic studies collecting data on rare variants, the focus is on assessing whether and how the variant profile changes with the disease subtype. Motivated by this application, we develop multiresolution nonparametric Bayes tests for differential mutation rates across groups. The multiresolution approach yields fast and accurate detection of spatial clusters of rare variants, and our nonparametric Bayes framework provides great flexibility for modeling the intensities of rare variants. Some theoretical properties are also assessed, including weak consistency of our Dirichlet Process-Poisson-Gamma mixture over multiple resolutions. Simulation studies illustrate excellent small sample properties relative to competitors, and we apply the method to detect rare variants related to common variable immunodeficiency from whole exome sequencing data on 215 patients and over 60,027 control subjects.

Description

Keywords

Multiresolution testing, Nonparametric Bayes, rare events, weak consistency

Citation