Reliability Degradation and Electric Conductivity of Remotely Heated Nanofilaments in Resistive Switching Memory Cells
| dc.contributor.author | Al-Mamun, Mohammad Shah | en |
| dc.contributor.author | Orlowski, Marius K. | en |
| dc.date.accessioned | 2022-02-21T19:33:39Z | en |
| dc.date.available | 2022-02-21T19:33:39Z | en |
| dc.date.issued | 2021-09-17 | en |
| dc.date.updated | 2022-02-21T19:33:05Z | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.orcid | Orlowski, Mariusz [0000-0002-1425-4058] | en |
| dc.identifier.uri | http://hdl.handle.net/10919/108788 | en |
| dc.language.iso | en | en |
| dc.relation.uri | http://www.albedomeetings.com/nanomeet/2022/index.php | en |
| dc.rights | In Copyright | en |
| dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
| dc.title | Reliability Degradation and Electric Conductivity of Remotely Heated Nanofilaments in Resistive Switching Memory Cells | en |
| dc.type | Conference proceeding | en |
| dc.type.dcmitype | Text | en |
| pubs.finish-date | 2021-09-17 | en |
| pubs.organisational-group | /Virginia Tech | en |
| pubs.organisational-group | /Virginia Tech/Engineering | en |
| pubs.organisational-group | /Virginia Tech/Engineering/Electrical and Computer Engineering | en |
| pubs.organisational-group | /Virginia Tech/All T&R Faculty | en |
| pubs.organisational-group | /Virginia Tech/Engineering/COE T&R Faculty | en |
| pubs.start-date | 2021-09-13 | en |