Electron tomography imaging methods with diffraction contrast for materials research

Simple item page
dc.contributor.authorHata, Satoshien
dc.contributor.authorFurukawa, Hiromitsuen
dc.contributor.authorGondo, Takashien
dc.contributor.authorHirakami, Daisukeen
dc.contributor.authorHorii, Noritakaen
dc.contributor.authorIkeda, Ken-Ichien
dc.contributor.authorKawamoto, Katsumien
dc.contributor.authorKimura, Kosukeen
dc.contributor.authorMatsumura, Syoen
dc.contributor.authorMitsuhara, Masatoshien
dc.contributor.authorMiyazaki, Hiroyaen
dc.contributor.authorMiyazaki, Shinsukeen
dc.contributor.authorMurayama, Mitsuhiroen
dc.contributor.authorNakashima, Hideharuen
dc.contributor.authorSaito, Hikaruen
dc.contributor.authorSakamoto, Masashien
dc.contributor.authorYamasaki, Shigetoen
dc.contributor.departmentMaterials Science and Engineeringen
dc.date.accessioned2021-09-24T16:44:34Zen
dc.date.available2021-09-24T16:44:34Zen
dc.date.issued2020-06-01en
dc.date.updated2021-09-24T16:44:31Zen
dc.description.abstractTransmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations) including a demonstration of in situ dislocation tomography.en
dc.description.versionPublished versionen
dc.format.extentPages 141-155en
dc.format.extent15 page(s)en
dc.format.mimetypeapplication/pdfen
dc.identifier.doihttps://doi.org/10.1093/jmicro/dfaa002en
dc.identifier.eissn2050-5701en
dc.identifier.issn2050-5698en
dc.identifier.issue3en
dc.identifier.orcidMurayama, Mitsuhiro [0000-0003-1965-4891]en
dc.identifier.other5770850 (PII)en
dc.identifier.pmid32115659en
dc.identifier.urihttp://hdl.handle.net/10919/105056en
dc.identifier.volume69en
dc.language.isoenen
dc.publisherOxford University Pressen
dc.relation.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000537524600001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=930d57c9ac61a043676db62af60056c1en
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectTechnologyen
dc.subjectMicroscopyen
dc.subjectelectron tomographyen
dc.subjectthree-dimensional (3D)en
dc.subjectdiffraction contrasten
dc.subjectdomain structureen
dc.subjectdislocationen
dc.subjectspecimen holderen
dc.subject3-DIMENSIONAL RECONSTRUCTIONen
dc.subjectMICROSTRUCTURAL CHARACTERIZATIONen
dc.subjectDISLOCATION LOOPSen
dc.subject3D RECONSTRUCTIONen
dc.subjectSTEM TOMOGRAPHYen
dc.subjectATOMIC-SCALEen
dc.subjectMICROSCOPYen
dc.subjectNANOPARTICLESen
dc.subjectTEMen
dc.subjectABSORPTIONen
dc.titleElectron tomography imaging methods with diffraction contrast for materials researchen
dc.title.serialMicroscopyen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten
dc.type.otherJournalen
dcterms.dateAccepted2020-02-04en
pubs.organisational-group/Virginia Techen
pubs.organisational-group/Virginia Tech/Engineeringen
pubs.organisational-group/Virginia Tech/Engineering/Materials Science and Engineeringen
pubs.organisational-group/Virginia Tech/All T&R Facultyen
pubs.organisational-group/Virginia Tech/Engineering/COE T&R Facultyen

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Electron tomography imaging methods with diffraction contrast for materials research.pdf
Size:
2.15 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download

Collections

All Faculty Deposits
Scholarly Works, Materials Science and Engineering (MSE)