Browsing by Author "Lin, Y. C."

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    The influences of surface treatment and gas annealing conditions on the inversion behaviors of the atomic-layer-deposition Al2O3/n-In0.53Ga0.47As metal-oxide-semiconductor capacitor
    Trinh, H. D.; Chang, E. Y.; Wu, P. W.; Wong, Y. Y.; Chang, C. T.; Hsieh, Y. F.; Yu, C. C.; Nguyen, H. Q.; Lin, Y. C.; Lin, K. L.; Hudait, Mantu K. (AIP Publishing, 2010-07-01)
    The inversion behaviors of atomic-layer-deposition Al2O3/n-In0.53Ga0.47As metal-oxide-semiconductor capacitors are studied by various surface treatments and postdeposition annealing using different gases. By using the combination of wet sulfide and dry trimethyl aluminum surface treatment along with pure hydrogen annealing, a strong inversion capacitance-voltage (C-V) response is observed, indicating a remarkable reduction in interface trap state density (D-it) at lower half-part of In0.53Ga0.47As band gap. This low D-it was confirmed by the temperature independent C-V stretch-out and horizontal C-V curves. The x-ray photoelectron spectroscopy spectra further confirm the effectiveness of hydrogen annealing on the reduction of native oxides. (C) 2010 American Institute of Physics. [doi:10.1063/1.3467813]
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    Observation of Electron-Antineutrino Disappearance at Daya Bay
    An, F. P.; Bai, J. Z.; Balantekin, A. B.; Band, H. R.; Beavis, D.; Beriguete, W.; Bishai, M.; Blyth, S.; Boddy, K.; Brown, R. L.; Cai, B.; Cao, G. F.; Cao, J.; Carr, Rachel E.; Chan, W. T.; Chang, J. F.; Chang, Y.; Chasman, C.; Chen, H. S.; Chen, H. Y.; Chen, S. J.; Chen, S. M.; Chen, X. C.; Chen, X. H.; Chen, X. S.; Chen, Y.; Chen, Y. X.; Cherwinka, J. J.; Chu, M. C.; Cummings, J. P.; Deng, Z. Y.; Ding, Y. Y.; Diwan, M. V.; Dong, L.; Draeger, E.; Du, X. F.; Dwyer, D. A.; Edwards, W. R.; Ely, S. R.; Fang, S. D.; Fu, J. Y.; Fu, Z. W.; Ge, L. Q.; Ghazikhanian, V.; Gill, R. L.; Goett, J.; Gonchar, M.; Gong, G. H.; Gong, H.; Gornushkin, Y. A.; Greenler, L. S.; Gu, W. Q.; Guan, M. Y.; Guo, X. H.; Hackenburg, R. W.; Hahn, R. L.; Hans, S.; He, M.; He, Q.; He, W. S.; Heeger, K. M.; Heng, Y. K.; Hinrichs, P.; Ho, T. H.; Hor, Y. K.; Hsiung, Y. B.; Hu, B. Z.; Hu, T.; Huang, H. X.; Huang, H. Z.; Huang, P. W.; Huang, X.; Huang, X. T.; Huber, Patrick; Isvan, Z.; Jaffe, D. E.; Jetter, S.; Ji, X. L.; Ji, X. P.; Jiang, H. J.; Jiang, W. Q.; Jiao, J. B.; Johnson, R. A.; Kang, L.; Kettell, S. H.; Kramer, M.; Kwan, K. K.; Kwok, M. W.; Kwok, T.; Lai, C. Y.; Lai, W. C.; Lai, W. H.; Lau, K.; Lebanowski, L.; Lee, J.; Lee, M. K. P.; Leitner, R.; Leung, J. K. C.; Leung, K. Y.; Lewis, C. A.; Li, B.; Li, F.; Li, G. S.; Li, J.; Li, Q. J.; Li, S. F.; Li, W. D.; Li, X. B.; Li, X. N.; Li, X. Q.; Li, Y.; Li, Z. B.; Liang, H.; Liang, J.; Lin, C. J.; Lin, G. L.; Lin, S. K.; Lin, S. X.; Lin, Y. C.; Ling, J. J.; Link, Jonathan M.; Littenberg, L.; Littlejohn, B. R.; Liu, B. J.; Liu, C.; Liu, D. W.; Liu, H.; Liu, J. C.; Liu, J. L.; Liu, S.; Liu, X.; Liu, Y. B.; Lu, C.; Lu, H. Q.; Luk, A.; Luk, K. B.; Luo, T.; Luo, X. L.; Ma, L. H.; Ma, Q. M.; Ma, X. B.; Ma, X. Y.; Ma, Y. Q.; Mayes, B.; McDonald, K. T.; McFarlane, M. C.; McKeown, R. D.; Meng, Y.; Mohapatra, D.; Morgan, J. E.; Nakajima, Y.; Napolitano, J.; Naumov, D.; Nemchenok, I.; Newsom, C.; Ngai, H. Y.; Ngai, W. K.; Nie, Y. B.; Ning, Z.; Ochoa-Ricoux, J. P.; Oh, D.; Olshevski, A.; Pagac, A.; Patton, S.; Pearson, C.; Pec, V.; Peng, J. C.; Piilonen, Leo E.; Pinsky, L.; Pun, C. S. J.; Qi, F. Z.; Qi, M.; Qian, X.; Raper, N.; Rosero, R.; Roskovec, B.; Ruan, X. C.; Seilhan, B.; Shao, B. B.; Shih, K.; Steiner, H.; Stoler, P.; Sun, G. X.; Sun, J. L.; Tam, Y. H.; Tanaka, H. K.; Tang, X.; Themann, H.; Torun, Y.; Trentalange, S.; Tsai, O.; Tsang, K. V.; Tsang, R. H. M.; Tull, C.; Viren, B.; Virostek, S.; Vorobel, V.; Wang, C. H.; Wang, L. S.; Wang, L. Y.; Wang, L. Z.; Wang, M.; Wang, N. Y.; Wang, R. G.; Wang, T.; Wang, W.; Wang, X.; Wang, Y. F.; Wang, Z.; Wang, Z. M.; Webber, D. M.; Wei, Y. D.; Wen, L. J.; Wenman, D. L.; Whisnant, K.; White, C. G.; Whitehead, L.; Whitten, C. A.; Wilhelmi, J.; Wise, T.; Wong, H. C.; Wong, H. L. H.; Wong, J.; Worcester, E.; Wu, F. F.; Wu, Q.; Xia, D. M.; Xiang, S. T.; Xiao, Q.; Xing, Z. Z.; Xu, G.; Xu, J.; Xu, J. L.; Xu, W.; Xu, Y.; Xue, T.; Yang, C. G.; Yang, L.; Ye, M.; Yeh, M.; Yeh, Y. S.; Yip, K.; Young, B. L.; Yu, Z. Y.; Zhan, L.; Zhang, C.; Zhang, F. H.; Zhang, J. W.; Zhang, Q. M.; Zhang, K.; Zhang, Q. X.; Zhang, S. H.; Zhang, Y. C.; Zhang, Y. H. Percival; Zhang, Y. X.; Zhang, Z. J.; Zhang, Z. P.; Zhang, Z. Y.; Zhao, J.; Zhao, Q. W.; Zhao, Y. B.; Zheng, L.; Zhong, W. L.; Zhou, L.; Zhou, Z. Y.; Zhuang, H. L.; Zou, J. H. (American Physical Society, 2012-04-23)
    The Daya Bay Reactor Neutrino Experiment has measured a nonzero value for the neutrino mixing angle 0(13) with a significance of 5.2 standard deviations. Antineutrinos from six 2.9 GW(th) reactors were detected in six antineutrino detectors deployed in two near (flux-weighted baseline 470 m and 576 m) and one far (1648 m) underground experimental halls. With a 43 000 ton-GW(th)-day live-time exposure in 55 days, 10 416 (80 376) electron-antineutrino candidates were detected at the far hall (near halls). The ratio of the observed to expected number of antineutrinos at the far hall is R = 0.940 +/- 0.011(stat.) +/- 0.004(syst.). A rate-only analysis finds sin(2)2 theta(13) = 0.092 +/- 0.016(stat.) +/- 0.005(syst.) in a three-neutrino framework.
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    Optical sectioning with a low-coherence phase-shifting digital holographic microscope
    Lin, Y. C.; Cheng, C. J.; Poon, Ting-Chung (Optical Society of America, 2011-03-01)
    The properties of a low-coherence phase-shifting digital holographic microscope are first studied and analyzed. We then demonstrate en face imaging with transverse resolution of 3 mu m and axial resolution of 10 mu m through a thickness of 300 mu m onion membrane. In addition, with the above said resolutions, optical sectioning of the eye and spine of a live zebra fish has been demonstrated. To the best of our knowledge, this is the first time that a short coherence phase-shifting holographic microscope has been applied to the internal structure visualization of a biological specimen under an in vivo environment. (C) 2010 Optical Society of America