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dc.contributor.authorThio, Chai-Liangen_US
dc.date.accessioned2014-03-14T21:52:29Z
dc.date.available2014-03-14T21:52:29Z
dc.date.issued1995en_US
dc.identifier.otheretd-12232009-020641en_US
dc.identifier.urihttp://hdl.handle.net/10919/46414
dc.format.mediumBTDen_US
dc.publisherVirginia Techen_US
dc.relation.haspartLD5655.V855_1995.T456.pdfen_US
dc.subjectfatigueen_US
dc.subjecthysteresisen_US
dc.subjectretentionen_US
dc.subjectimprinten_US
dc.subjectpolarizationen_US
dc.subject.lccLD5655.V855 1995.T456en_US
dc.titleElectrical characterization of ferroelectric capacitors for non-volatile memory applicationsen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical Engineeringen_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-12232009-020641/en_US
dc.date.sdate2009-12-23en_US
dc.date.rdate2009-12-23
dc.date.adate2009-12-23en_US


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