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dc.contributor.authorHarms, Alan E.en
dc.date.accessioned2016-02-01T18:05:39Zen
dc.date.available2016-02-01T18:05:39Zen
dc.date.issued1973en
dc.identifier.urihttp://hdl.handle.net/10919/64694en
dc.description.abstractUsing a singular solution for a part circular crack by F. W. Smith, a Taylor Series Correction Method (TSCM) was verified for extracting stress intensity factors from photoelastic data. Photoelastic experiments were then conducted on plates with part circular and flat bottomed cracks for flaw depth to thickness ratios of 0.25, 0.50 and 0.75 and for equivalent flaw depth to equivalent ellipse length values ranging from 0.066 to 0.319. Experimental results agreed well with the Smith theory but indicated that the use of the "equivalent" semi-elliptical flaw for correlating the part circular flaw results with semi-elliptical flaw results was not valid for a/2c<< 0.20. Best overall agreement for the moderate (a/t ≃ 0.5) to deep flaws (a/t ≃ 0.75) and a/2c > 0.15 was found with a semi-empirical theory due to J. C. Newman when compared on the basis of equivalent flaw depth and area. The Smith theory, when correlated on the basis of flaw depth and area, appears to yield reasonable estimates (within 10%) of the SIF for flat bottomed flaws for the geometries studied here.en
dc.format.extentvii, 57 leavesen
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 34065705en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1973.H36en
dc.titleStress intensity factors for long, deep surface flaws in plates under extentional fieldsen
dc.typeThesisen
dc.contributor.departmentEngineering Science and Mechanicsen
dc.description.degreeMaster of Scienceen
thesis.degree.nameMaster of Scienceen
thesis.degree.levelmastersen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.disciplineEngineering Science and Mechanicsen
dc.type.dcmitypeTexten


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