Reliability-Based Topology Optimization with Analytic Sensitivities
dc.contributor.author | Clark, Patrick Ryan | en |
dc.contributor.committeechair | Patil, Mayuresh J. | en |
dc.contributor.committeemember | Kapania, Rakesh K. | en |
dc.contributor.committeemember | Canfield, Robert A. | en |
dc.contributor.department | Aerospace and Ocean Engineering | en |
dc.date.accessioned | 2017-08-04T08:00:24Z | en |
dc.date.available | 2017-08-04T08:00:24Z | en |
dc.date.issued | 2017-08-03 | en |
dc.description.abstract | It is a common practice when designing a system to apply safety factors to the critical failure load or event. These safety factors provide a buffer against failure due to the random or un-modeled behavior, which may lead the system to exceed these limits. However these safety factors are not directly related to the likelihood of a failure event occurring. If the safety factors are poorly chosen, the system may fail unexpectedly or it may have a design which is too conservative. Reliability-Based Design Optimization (RBDO) is an alternative approach which directly considers the likelihood of failure by incorporating a reliability analysis step such as the First-Order Reliability Method (FORM). The FORM analysis requires the solution of an optimization problem however, so implementing this approach into an RBDO routine creates a double-loop optimization structure. For large problems such as Reliability-Based Topology Optimization (RBTO), numeric sensitivity analysis becomes computationally intractable. In this thesis, a general approach to the sensitivity analysis of nested functions is developed from the Lagrange Multiplier Theorem and then applied to several Reliability-Based Design Optimization problems, including topology optimization. The proposed approach is computationally efficient, requiring only a single solution of the FORM problem each iteration. | en |
dc.description.abstractgeneral | It is a common practice when designing a system to apply safety factors to the critical failure load or event. These safety factors provide a buffer against failure due to the random or unmodeled behavior, which may lead the system to exceed these limits. However these safety factors are not directly related to the likelihood of a failure event occurring. If the safety factors are poorly chosen, the system may fail unexpectedly or it may have a design which is too conservative. Reliability-Based Design Optimization (RBDO) is an alternative approach which directly considers the likelihood of failure by incorporating a reliability analysis step such as the First-Order Reliability Method (FORM). The FORM analysis requires the solution of an optimization problem however, so implementing this approach into an RBDO routine creates a double-loop optimization structure. For large problems such as Reliability-Based Topology Optimization (RBTO), numeric sensitivity analysis becomes computationally intractable. In this thesis, a general approach to the sensitivity analysis of nested functions is developed from the Lagrange Multiplier Theorem and then applied to several Reliability-Based Design Optimization problems, including topology optimization. The proposed approach is computationally efficient, requiring only a single solution of the FORM problem each iteration. | en |
dc.description.degree | Master of Science | en |
dc.format.medium | ETD | en |
dc.identifier.other | vt_gsexam:12346 | en |
dc.identifier.uri | http://hdl.handle.net/10919/78665 | en |
dc.publisher | Virginia Tech | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Reliability-Based Topology Optimization | en |
dc.subject | First-Order Reliability Method | en |
dc.subject | Sensitivity Analysis | en |
dc.title | Reliability-Based Topology Optimization with Analytic Sensitivities | en |
dc.type | Thesis | en |
thesis.degree.discipline | Aerospace Engineering | en |
thesis.degree.grantor | Virginia Polytechnic Institute and State University | en |
thesis.degree.level | masters | en |
thesis.degree.name | Master of Science | en |
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