A methodology for self-testing microprocessors

dc.contributor.authorHaislett, David W.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2017-01-30T21:02:19Zen
dc.date.available2017-01-30T21:02:19Zen
dc.date.issued1982en
dc.description.abstractProcedures for designing and writing a CPU self-test program are developed for microprocessors in general. Specific examples of these procedures are then provided for both a simple example processor and for the Intel 8080; fault coverage statistics are provided for the 8080 test. The self-test methodology overlaps the tests for different elements within the CPU in order to attain a very quick test suitable for periodic background testing. Generalized fault classes are defined for the CPU and methods for sensitizing and detecting these faults are detailed. General procedures and hardware requirements for self-testing the entire microcomputer system within its operating environment are discussed. Fault simulation techniques are also discussed; simulation provides feedback on the effectiveness of a self-test and allows the test to be improved for better coverage and faster execution.en
dc.description.degreeMaster of Scienceen
dc.format.extentvi, 327, [1] leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/74474en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 8706457en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1982.H347en
dc.subject.lcshMicroprocessors -- Testingen
dc.titleA methodology for self-testing microprocessorsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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