An intelligent workstation for reliable residual stress determination using x-ray diffraction

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dc.contributor.authorDehan, Christophe F.en
dc.contributor.committeechairHendricks, Robert Wayneen
dc.contributor.committeememberDowling, Norman E.en
dc.contributor.committeememberRoach, John W.en
dc.contributor.departmentMaterials Engineeringen
dc.date.accessioned2014-03-14T21:37:45Zen
dc.date.adate2012-06-10en
dc.date.available2014-03-14T21:37:45Zen
dc.date.issued1989-07-05en
dc.date.rdate2012-06-10en
dc.date.sdate2012-06-10en
dc.description.abstractRecent hardware developments of automated, high speed, portable X-ray diffraction instrumentation have not yet resulted in widespread use of the technique in industry despite its potentials. We suggest that these hardware developments require an equivalent development in the training of instrument operators in order to guarantee the integrity of the resulting data, as well as to enhance the understanding of such materials characterization data. The hurdle to date is the variety of skills necessary in a wide range of scientific and engineering disciplines and which are not commonly found in a single individual. We suggest that a computer-based system, integrating visualization tools, knowledge bases and analysis-capabilities and which is focused on the operator performance can provide an efficient solution to this problem, as it changes the enactment of the stress determination work process.en
dc.description.degreeMaster of Scienceen
dc.format.extentix, 183 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-06102012-040457en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-06102012-040457/en
dc.identifier.urihttp://hdl.handle.net/10919/43086en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1989.D442.pdfen
dc.relation.isformatofOCLC# 20432603en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1989.D442en
dc.subject.lcshEngineering instrumentsen
dc.subject.lcshX-rays -- Diffractionen
dc.titleAn intelligent workstation for reliable residual stress determination using x-ray diffractionen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineMaterials Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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