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CH4 Adsorption Probability on GaN(0001) and (000−1) during Metalorganic Vapor Phase Epitaxy and Its Relationship to Carbon Contamination in the Films

dc.contributor.authorKusaba, Akiraen
dc.contributor.authorLi, Guanchenen
dc.contributor.authorKempisty, Pawelen
dc.contributor.authorvon Spakovsky, Michael R.en
dc.contributor.authorKangawa, Yoshihiroen
dc.contributor.departmentMechanical Engineeringen
dc.date.accessioned2019-04-01T12:00:48Zen
dc.date.available2019-04-01T12:00:48Zen
dc.date.issued2019-03-23en
dc.date.updated2019-03-29T19:40:52Zen
dc.description.abstractSuppression of carbon contamination in GaN films grown using metalorganic vapor phase epitaxy (MOVPE) is a crucial issue in its application to high power and high frequency electronic devices. To know how to reduce the C concentration in the films, a sequential analysis based on first principles calculations is performed. Thus, surface reconstruction and the adsorption of the CH<sub>4</sub> produced by the decomposition of the Ga source, Ga(CH<sub>3</sub>)<sub>3</sub>, and its incorporation into the GaN sub-surface layers are investigated. In this sequential analysis, the dataset of the adsorption probability of CH<sub>4</sub> on reconstructed surfaces is indispensable, as is the energy of the C impurity in the GaN sub-surface layers. The C adsorption probability is obtained based on steepest-entropy-ascent quantum thermodynamics (SEAQT). SEAQT is a thermodynamic ensemble-based, non-phenomenological framework that can predict the behavior of non-equilibrium processes, even those far from equilibrium. This framework is suitable especially when one studies the adsorption behavior of an impurity molecule because the conventional approach, the chemical potential control method, cannot be applied to a quantitative analysis for such a system. The proposed sequential model successfully explains the influence of the growth orientation, GaN(0001) and (000&minus;1), on the incorporation of C into the film. This model can contribute to the suppression of the C contamination in GaN MOVPE.en
dc.description.versionPublished versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationKusaba, A.; Li, G.; Kempisty, P.; von Spakovsky, M.R.; Kangawa, Y. CH4 Adsorption Probability on GaN(0001) and (000−1) during Metalorganic Vapor Phase Epitaxy and Its Relationship to Carbon Contamination in the Films. Materials 2019, 12, 972.en
dc.identifier.doihttps://doi.org/10.3390/ma12060972en
dc.identifier.urihttp://hdl.handle.net/10919/88769en
dc.language.isoenen
dc.publisherMDPIen
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectmetalorganic vapor phase epitaxyen
dc.subjectgallium nitrideen
dc.subjectdensity functional theory calculationsen
dc.subjectsteepest-entropy-ascent quantum thermodynamicsen
dc.titleCH4 Adsorption Probability on GaN(0001) and (000−1) during Metalorganic Vapor Phase Epitaxy and Its Relationship to Carbon Contamination in the Filmsen
dc.title.serialMaterialsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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