Test scheduling and configuration in a self-repairing computer
dc.contributor.author | Gregory, Walter Lee | en |
dc.contributor.committeechair | Thompson, Richard A. | en |
dc.contributor.committeemember | Gray, Festus Gail | en |
dc.contributor.committeemember | Bostian, Charles W. | en |
dc.contributor.department | Electrical Engineering | en |
dc.date.accessioned | 2014-03-14T21:38:20Z | en |
dc.date.adate | 2010-06-12 | en |
dc.date.available | 2014-03-14T21:38:20Z | en |
dc.date.issued | 1977-05-15 | en |
dc.date.rdate | 2010-06-12 | en |
dc.date.sdate | 2010-06-12 | en |
dc.description.abstract | The structure of cellular arrays and Tessellation Automata are introduced as a "fabric" for use in the implementation of self-testing and self-repairing computational configurations. Testing schemes are suggested for use in the "self-testing" operation of this computer system. Sequentially propagating tests are examined for both finite and infinite geometries of cellular arrays. A static parallel testing procedure is also suggested which offers these advantages: (1) the parallel testing procedure is transparent to the computer configuration, (2) very little computational down-time" results from testing, and (3) the parallel testing procedure does not initiate reconfiguration of the computational configuration. | en |
dc.description.degree | Master of Science | en |
dc.format.extent | viii, 103 leaves | en |
dc.format.medium | BTD | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.other | etd-06122010-020251 | en |
dc.identifier.sourceurl | http://scholar.lib.vt.edu/theses/available/etd-06122010-020251/ | en |
dc.identifier.uri | http://hdl.handle.net/10919/43244 | en |
dc.language.iso | en | en |
dc.publisher | Virginia Tech | en |
dc.relation.haspart | LD5655.V855_1977.G74.pdf | en |
dc.relation.isformatof | OCLC# 39802592 | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | computational configurations | en |
dc.subject.lcc | LD5655.V855 1977.G74 | en |
dc.title | Test scheduling and configuration in a self-repairing computer | en |
dc.type | Thesis | en |
dc.type.dcmitype | Text | en |
thesis.degree.discipline | Electrical Engineering | en |
thesis.degree.grantor | Virginia Polytechnic Institute and State University | en |
thesis.degree.level | masters | en |
thesis.degree.name | Master of Science | en |
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