VTechWorks staff will be away for the winter holidays starting Tuesday, December 24, 2024, through Wednesday, January 1, 2025, and will not be replying to requests during this time. Thank you for your patience, and happy holidays!
 

Test generation for behavioral models with reconvergent fanout and feed-back

dc.contributor.authorLam, Fong-Sheken
dc.contributor.committeechairArmstrong, James R.en
dc.contributor.committeememberMidkiff, Scott F.en
dc.contributor.committeememberTront, Joseph G.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:41:09Zen
dc.date.adate2012-07-24en
dc.date.available2014-03-14T21:41:09Zen
dc.date.issued1989-09-15en
dc.date.rdate2012-07-24en
dc.date.sdate2012-07-24en
dc.description.abstractIn this thesis, new methods to handle reconvergent fanout and feed-back during behavioral level test generation are proposed. These methods have been implemented - into a previously developed automatic test generator. The improved test generator was tested on five behavioral circuit models. For circuits with the reconvergent fanout situation, the improved test generator can generate tests completely automatically. For circuits with feed-back, user assistance in a circuit initialization step is required. Some suggestions for future development for the test generator are discussed. Examples on how to use the improved test generator are presented.en
dc.description.degreeMaster of Scienceen
dc.format.extentix, 126 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-07242012-040138en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-07242012-040138/en
dc.identifier.urihttp://hdl.handle.net/10919/43900en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1989.L35.pdfen
dc.relation.isformatofOCLC# 20765800en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1989.L35en
dc.subject.lcshIntegrated circuits -- Very large scale integration -- Researchen
dc.titleTest generation for behavioral models with reconvergent fanout and feed-backen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

Files

Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
LD5655.V855_1989.L35.pdf
Size:
4.84 MB
Format:
Adobe Portable Document Format
Description:

Collections