Selection of flip-flops for partial scan paths by use of a statistical testability measure

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dc.contributor.authorJett, David B.en
dc.contributor.committeememberHa, Dong Samen
dc.contributor.committeememberTront, Joseph G.en
dc.contributor.committeememberMidkiff, Scott F.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:52:39Zen
dc.date.adate2008-12-30en
dc.date.available2014-03-14T21:52:39Zen
dc.date.issued1992-09-05en
dc.date.rdate2008-12-30en
dc.date.sdate2008-12-30en
dc.description.abstractPartial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. Design constraints may require that a partial scan path include only those flip-flops that provide the greatest improvements in circuit testability. STAFFS, a tool that identifies such flip-flops, has been developed. It uses a statistical testability measure to acquire quantitative data for the controllabilities and observabilities of the nodes of a circuit. It predicts the changes that would occur in the data due to the scanning of specific flip-flops, and uses those predictions to select flip-flops. STAFFS weights the observability data versus the controllability data when selecting flip-flops, and it can efficiently select alternative scan designs for different weights. Experimental results for thirteen sequential benchmark circuits reveal that STAFFS consistently selects scan designs with fault coverages that are significantly higher than those of arbitrarily selected scan designs.en
dc.description.degreeMaster of Scienceen
dc.format.extentvii, 68 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-12302008-063234en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-12302008-063234/en
dc.identifier.urihttp://hdl.handle.net/10919/46437en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1992.J488.pdfen
dc.relation.isformatofOCLC# 27701246en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1992.J488en
dc.subject.lcshDigital electronicsen
dc.subject.lcshDigital integrated circuits -- Design and construction -- Data processingen
dc.titleSelection of flip-flops for partial scan paths by use of a statistical testability measureen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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