Image degradation due to diffraction, reflection, and scattering in an optical system

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dc.contributor.authorZadnik, Jerome A.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2017-11-09T20:41:41Zen
dc.date.available2017-11-09T20:41:41Zen
dc.date.issued1987en
dc.description.abstractThe focal plane power distribution due to a bright source is analyzed for an infrared imaging optical system. Irradiance from the bright source is spread throughout the focal plane according to the characteristics of the system. This effect is attributed to diffraction, reflection and scattering in the optical train. Expected focal plane power distributions due to diffraction and multiple reflections between dielectric surfaces are calculated and compared to measured data. The difference is attributed to scatter characteristics of the optical elements. A brief overview of the major sources of scatter lays groundwork for a further analysis of scattering characteristics in the optical system.en
dc.description.degreeMaster of Scienceen
dc.format.extent31 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/80064en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 16655859en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1987.Z32en
dc.subject.lcshImaging systemsen
dc.subject.lcshInfrared imagingen
dc.subject.lcshOpticsen
dc.titleImage degradation due to diffraction, reflection, and scattering in an optical systemen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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