Measurements of branching fractions of Ac plus , E plus eta and Ac plus , E plus eta i and asymmetry parameters of Ac+, E+pi 0, Ac+, E+ eta, and Ac plus , E plus eta i

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dc.contributor.authorLi, S. X.en
dc.contributor.authorShen, C. P.en
dc.contributor.authorAdachi, I.en
dc.contributor.authorAhn, J. K.en
dc.contributor.authorAihara, H.en
dc.contributor.authorAsner, D. M.en
dc.contributor.authorAtmacan, H.en
dc.contributor.authorAushev, T.en
dc.contributor.authorAyad, R.en
dc.contributor.authorBabu, V.en
dc.contributor.authorBahinipati, S.en
dc.contributor.authorBanerjee, Swen
dc.contributor.authorBehera, P.en
dc.contributor.authorBelous, K.en
dc.contributor.authorBennett, J.en
dc.contributor.authorBessner, M.en
dc.contributor.authorBilka, T.en
dc.contributor.authorBiswas, D.en
dc.contributor.authorBobrov, A.en
dc.contributor.authorBodrov, D.en
dc.contributor.authorBorah, J.en
dc.contributor.authorBra, M.en
dc.contributor.authorBranchini, P.en
dc.contributor.authorBrowder, T. E.en
dc.contributor.authorBudano, A.en
dc.contributor.authorCampajola, M.en
dc.contributor.authorChang, M. -C.en
dc.contributor.authorChang, P.en
dc.contributor.authorChekelian, V.en
dc.contributor.authorChen, A.en
dc.contributor.authorCheon, B. G.en
dc.contributor.authorChilikin, K.en
dc.contributor.authorCho, H. E.en
dc.contributor.authorCho, K.en
dc.contributor.authorCho, S. -J.en
dc.contributor.authorChoi, S. -K.en
dc.contributor.authorChoi, Y.en
dc.contributor.authorChoudhury, S.en
dc.contributor.authorCinabro, D.en
dc.contributor.authorDe Pietro, G.en
dc.contributor.authorDhamija, R.en
dc.contributor.authorDi Capua, F.en
dc.contributor.authorDong, T. V.en
dc.contributor.authorFerber, T.en
dc.contributor.authorFrey, A.en
dc.contributor.authorFulsom, B. G.en
dc.contributor.authorGaur, V.en
dc.contributor.authorGiri, A.en
dc.contributor.authorGoldenzweig, P.en
dc.contributor.authorGraziani, E.en
dc.contributor.authorGu, T.en
dc.contributor.authorGudkova, K.en
dc.contributor.authorHadjivasiliou, C.en
dc.contributor.authorHayasaka, K.en
dc.contributor.authorHayashii, H.en
dc.contributor.authorHsu, C. -L.en
dc.contributor.authorInami, K.en
dc.contributor.authorIpsita, N.en
dc.contributor.authorIshikawa, A.en
dc.contributor.authorItoh, R.en
dc.contributor.authorJacobs, W. W.en
dc.contributor.authorJin, Y.en
dc.contributor.authorJoo, K. K.en
dc.contributor.authorKalita, D.en
dc.contributor.authorKaliyar, A. B.en
dc.contributor.authorKiesling, C.en
dc.contributor.authorKim, C. H.en
dc.contributor.authorKim, D. Y.en
dc.contributor.authorKim, K. -H.en
dc.contributor.authorKim, Y. -K.en
dc.contributor.authorKody, P.en
dc.contributor.authorKonno, T.en
dc.contributor.authorKorobov, A.en
dc.contributor.authorKorpar, S.en
dc.contributor.authorKovalenko, E.en
dc.contributor.authorKrokovny, P.en
dc.contributor.authorKuhr, T.en
dc.contributor.authorKumar, M.en
dc.contributor.authorKumar, R.en
dc.contributor.authorKumara, K.en
dc.contributor.authorKuzmin, A.en
dc.contributor.authorKwon, Y. -J.en
dc.contributor.authorLam, T.en
dc.contributor.authorLange, J. S.en
dc.contributor.authorLee, S. C.en
dc.contributor.authorLi, L. K.en
dc.contributor.authorLi, Y.en
dc.contributor.authorLi, Y. B.en
dc.contributor.authorLi Gioi, L.en
dc.contributor.authorLibby, J.en
dc.contributor.authorLieret, K.en
dc.contributor.authorMasuda, M.en
dc.contributor.authorMatsuda, T.en
dc.contributor.authorMaurya, S. K.en
dc.contributor.authorMeier, F.en
dc.contributor.authorMerola, M.en
dc.contributor.authorMetzner, F.en
dc.contributor.authorMizuk, R.en
dc.contributor.authorMussa, R.en
dc.contributor.authorNakamura, I.en
dc.contributor.authorNakao, M.en
dc.contributor.authorNatkaniec, Z.en
dc.contributor.authorNatochii, A.en
dc.contributor.authorNayak, L.en
dc.contributor.authorNiiyama, M.en
dc.contributor.authorNisar, N. K.en
dc.contributor.authorNishida, S.en
dc.contributor.authorOgawa, S.en
dc.contributor.authorOno, H.en
dc.contributor.authorOnuki, Y.en
dc.contributor.authorOskin, P.en
dc.contributor.authorPakhlova, G.en
dc.contributor.authorPardi, S.en
dc.contributor.authorPark, H.en
dc.contributor.authorPatra, S.en
dc.contributor.authorPaul, S.en
dc.contributor.authorPedlar, T. K.en
dc.contributor.authorPestotnik, R.en
dc.contributor.authorPiilonen, Leo E.en
dc.contributor.authorPrencipe, E.en
dc.contributor.authorPrim, M. T.en
dc.contributor.authorRout, N.en
dc.contributor.authorRusso, G.en
dc.contributor.authorSahoo, D.en
dc.contributor.authorSandilya, S.en
dc.contributor.authorSangal, A.en
dc.contributor.authorSantelj, L.en
dc.contributor.authorSavinov, V.en
dc.contributor.authorSchnell, G.en
dc.contributor.authorSchwanda, C.en
dc.contributor.authorSeino, Y.en
dc.contributor.authorSenyo, K.en
dc.contributor.authorSevior, M. E.en
dc.contributor.authorShan, W.en
dc.contributor.authorShapkin, M.en
dc.contributor.authorSharma, C.en
dc.contributor.authorShiu, J. -G.en
dc.contributor.authorSokolov, A.en
dc.contributor.authorSolovieva, E.en
dc.contributor.authorStari, M.en
dc.contributor.authorSumihama, M.en
dc.contributor.authorSumisawa, K.en
dc.contributor.authorSumiyoshi, T.en
dc.contributor.authorSutcliffe, W.en
dc.contributor.authorTakizawa, M.en
dc.contributor.authorTamponi, U.en
dc.contributor.authorTanida, K.en
dc.contributor.authorTenchini, F.en
dc.contributor.authorUchida, M.en
dc.contributor.authorUglov, T.en
dc.contributor.authorUnno, Y.en
dc.contributor.authorUno, S.en
dc.contributor.authorVahsen, S. E.en
dc.contributor.authorvan Tonder, R.en
dc.contributor.authorVarner, G.en
dc.contributor.authorVinokurova, A.en
dc.contributor.authorWaheed, E.en
dc.contributor.authorWang, E.en
dc.contributor.authorWatanabe, M.en
dc.contributor.authorWatanuki, S.en
dc.contributor.authorWon, E.en
dc.contributor.authorYabsley, B. D.en
dc.contributor.authorYan, W.en
dc.contributor.authorYang, S. B.en
dc.contributor.authorYelton, J.en
dc.contributor.authorYin, J. H.en
dc.contributor.authorYuan, C. Z.en
dc.contributor.authorZhang, Z. P.en
dc.contributor.authorZhilich, V.en
dc.date.accessioned2024-01-22T13:43:58Zen
dc.date.available2024-01-22T13:43:58Zen
dc.date.issued2023-02-14en
dc.description.abstractWe report a study of Λc+→ς+π0, Λc+→ς+η, and Λc+→ς+η′ using the data sample corresponding to an integrated luminosity of 980 fb-1 collected with the Belle detector at the KEKB asymmetric-energy e+e- collider. The branching fractions relative to Λc+→ς+π0 are measured as BΛc+→ς+η/BΛc+→ς+π0=0.25±0.03±0.01 and BΛc+→ς+η′/BΛc+→ς+π0=0.33±0.06±0.02. Using BΛc+→ς+π0=(1.25±0.10)%, we obtain BΛc+→ς+η=(3.14±0.35±0.17±0.25)×10-3 and BΛc+→ς+η′=(4.16±0.75±0.25±0.33)×10-3. Here the uncertainties are statistical, systematic, and from BΛc+→ς+π0, respectively. The ratio of the branching fraction of Λc+→ς+η′ with respect to that of Λc+→ς+η is measured to be BΛc+→ς+η′/BΛc+→ς+η=1.34±0.28±0.08. We update the asymmetry parameter of Λc+→ς+π0, ας+π0=-0.48±0.02±0.02, with a considerably improved precision. The asymmetry parameters of Λc+→ς+η and Λc+→ς+η′ are measured to be ας+η=-0.99±0.03±0.05 and ας+η′=-0.46±0.06±0.03 for the first time.en
dc.description.versionAccepted versionen
dc.format.extent12 page(s)en
dc.format.mimetypeapplication/pdfen
dc.identifierARTN 032003 (Article number)en
dc.identifier.doihttps://doi.org/10.1103/PhysRevD.107.032003en
dc.identifier.eissn2470-0029en
dc.identifier.issn2470-0010en
dc.identifier.issue3en
dc.identifier.orcidPiilonen, Leo [0000-0001-6836-0748]en
dc.identifier.urihttps://hdl.handle.net/10919/117448en
dc.identifier.volume107en
dc.language.isoenen
dc.publisherAmerican Physical Societyen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleMeasurements of branching fractions of Ac plus , E plus eta and Ac plus , E plus eta i and asymmetry parameters of Ac+, E+pi 0, Ac+, E+ eta, and Ac plus , E plus eta ien
dc.title.serialPhysical Review Den
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten
dc.type.otherArticleen
dc.type.otherJournalen
pubs.organisational-group/Virginia Techen
pubs.organisational-group/Virginia Tech/Scienceen
pubs.organisational-group/Virginia Tech/Science/Physicsen
pubs.organisational-group/Virginia Tech/All T&R Facultyen
pubs.organisational-group/Virginia Tech/Science/COS T&R Facultyen

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