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Sample and counting variations associated with x-ray flourescence [sic] analysis

dc.contributor.authorDavis, Robert Loyalen
dc.contributor.departmentStatisticsen
dc.date.accessioned2023-04-20T14:53:46Zen
dc.date.available2023-04-20T14:53:46Zen
dc.date.issued1966en
dc.description.abstractX-ray fluorescence methods offer the chemist a much speedier analysis of multicomponent mixtures than conventional procedures. Components can be analyzed by measuring the intensity of emission lines sent out after rays strike the mixture, However, variations in the measurement of intensity do occur and are discussed in this paper. Counting error, or the inability to duplicate the exact number of radiation counts from sample to sample, is investigated and its distribution and variance are derived. Using a hierarchical model variances of batch, sample, and within sample effects are examined. These variances are compared with each other and with counting variance.en
dc.description.degreeM. S.en
dc.format.extent41 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/114698en
dc.language.isoenen
dc.publisherVirginia Polytechnic Instituteen
dc.relation.isformatofOCLC# 20050553en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1966.D32en
dc.subject.lcshSampling (Statistics)en
dc.subject.lcshX-raysen
dc.titleSample and counting variations associated with x-ray flourescence [sic] analysisen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineStatisticsen
thesis.degree.grantorVirginia Polytechnic Instituteen
thesis.degree.levelmastersen
thesis.degree.nameM. S.en

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