A study of high-K dielectric materials in conjunction with a multilayer thick-film system

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dc.contributor.authorReddy, Rajen
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:38:26Zen
dc.date.adate2010-06-12en
dc.date.available2014-03-14T21:38:26Zen
dc.date.issued1988en
dc.date.rdate2010-06-12en
dc.date.sdate2010-06-12en
dc.description.abstractA new family of dielectric materials has been studied, individually as thick-film capacitors and as buried components incorporated in second-order lowpass and bandpass RC active filter circuits. The materials were electrically characterized in terms of the variation of dielectric constant and dissipation factor with frequency. The performance of the filter circuit is related to the characteristics of the dielectric materials. An analysis of the circuit is developed which accounts for the capacitor losses.en
dc.description.degreeMaster of Scienceen
dc.format.extentx, 80 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-06122010-020541en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-06122010-020541/en
dc.identifier.urihttp://hdl.handle.net/10919/43280en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1988.R422.pdfen
dc.relation.isformatofOCLC# 18315936en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1988.R422en
dc.subject.lcshDielectric devicesen
dc.subject.lcshThick filmsen
dc.titleA study of high-K dielectric materials in conjunction with a multilayer thick-film systemen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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