Spectral domain interferometry: A high-sensitivity, high-speed approach to quantitative phase imaging

dc.contributor.authorShang, Ruiboen
dc.contributor.committeechairZhu, Yizhengen
dc.contributor.committeememberXu, Yongen
dc.contributor.committeememberAgah, Masouden
dc.contributor.departmentElectrical and Computer Engineeringen
dc.date.accessioned2015-07-02T08:00:45Zen
dc.date.available2015-07-02T08:00:45Zen
dc.date.issued2015-07-01en
dc.description.abstractMany biological specimens are transparent and in weak intensity contrast, making it invisible using conventional bright field microscopes. Therefore, the phase-based optical microscopy techniques play important roles in the development of the modern biomedical science. Furthermore, the ability to achieve quantitative phase measurement of the tiny structures of biomedical specimens is of great importance for many biomedical applications. Thus, quantitative phase imaging becomes an important technique to measure the phase variations due to the difference of refractive index and geometric thickness of various structures and materials within the biomedical specimens. In this thesis, a spectral modulation interferometry (SMI) is developed to achieve quantitative phase imaging. In SMI, the phase and amplitude information will simultaneously be modulated onto the interference spectrum of the broadband light. Full-field phase images can be obtained by scanning along the orthogonal direction only. SMI incorporates the advantages of low coherence from broadband light source, high sensitivity from spectral domain interferometry and the high speed from the spectral modulation technique to achieve quantitative phase measurement with free of speckle, high temporal sensitivity (~0.1nm) and fast imaging rate. The principles of SMI system and programming as well as some important image processing methods will be discussed in detail. Besides, the quantitative phase measurement of the reflective object (USAF resolution target) and the transmitted biological objects (Peranema, human cheek cells) will be shown.en
dc.description.degreeMaster of Scienceen
dc.format.mediumETDen
dc.identifier.othervt_gsexam:5665en
dc.identifier.urihttp://hdl.handle.net/10919/54001en
dc.publisherVirginia Techen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectInterference microscopyen
dc.subjectInterferometric imagingen
dc.subjectCoherence imagingen
dc.subjectPhase measurementen
dc.titleSpectral domain interferometry: A high-sensitivity, high-speed approach to quantitative phase imagingen
dc.typeThesisen
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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