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Transient fault detection using a watchdog processor

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dc.contributor.authorBecker, Brian Alanen
dc.contributor.committeechairTront, Joseph G.en
dc.contributor.committeememberArmstrong, James R.en
dc.contributor.committeememberHa, Dong Samen
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:49:23Zen
dc.date.adate2009-11-10en
dc.date.available2014-03-14T21:49:23Zen
dc.date.issued1993-01-18en
dc.date.rdate2009-11-10en
dc.date.sdate2009-11-10en
dc.description.abstractMicroprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered.en
dc.description.degreeMaster of Scienceen
dc.format.extentx, 146 leaves (some folded)en
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-11102009-020108en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-11102009-020108/en
dc.identifier.urihttp://hdl.handle.net/10919/45599en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1993.B435.pdfen
dc.relation.isformatofOCLC# 27871470en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1993.B435en
dc.subject.lcshElectric fault locationen
dc.subject.lcshMicroprocessorsen
dc.titleTransient fault detection using a watchdog processoren
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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