Data analysis for characterization of IG110 and A3 by X-Ray diffraction and Raman spectroscopy

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dc.contributor.authorWu, Hualien
dc.contributor.authorGakhar, Ruchien
dc.contributor.authorChen, Allenen
dc.contributor.authorZhou, Zhouen
dc.contributor.authorScarlat, Raluca O.en
dc.contributor.departmentMechanical Engineeringen
dc.date.accessioned2021-02-03T15:51:19Zen
dc.date.available2021-02-03T15:51:19Zen
dc.date.issued2020-10en
dc.description.abstractThis article contains data related to the research journal paper titled 'Comparative Analysis of Microstructure and Reactive Sites for Nuclear Graphite IG-110 and Graphite Matrix A3", Journal of Nuclear Materials 528 (2020) 151802. This article includes details of the calculation process of the crystallite edge area, additional tables and figures of XRD and Raman data, and additional summary of data reduction methods used in prior literature for the characterization of IG-110 nuclear graphite. Reduced data associated with this article is provided in the supplementary information. Raw data associated with this article is in the supplementary material of the companion article. (C) 2020 Published by Elsevier Inc.en
dc.description.notesThis work was supported by U.S. DOE NEUP grants 15-8352 and IRPDE-NE0008285, and U.S. NRC Grant NRC-HQ-84-15-G-0046. Instrumentation support at the UW Materials Research Science and Engineering Center was provided by NSF Grant DMR-1121288 for XRD facilities and DMR-1121288, 0079983 and 0520057 and for Raman analysis. Authors thank Tim Burchell, Cristian Contescu and Michael P. Trammell at ORNL and Lin -wen Hu, David Carpenter and Tony Zheng at the MIT Nuclear Reactor for providing graphite samples and information about the manufacturing process, and Gabriel Meric de Bellefon at University of Wisconsin-Madison for discussion of XRD analysis.en
dc.description.sponsorshipU.S. DOE NEUPUnited States Department of Energy (DOE) [15-8352, IRPDE-NE0008285]; U.S. NRC Grant [NRC-HQ-84-15-G-0046]; NSFNational Science Foundation (NSF) [DMR-1121288, 0079983, 0520057]en
dc.format.mimetypeapplication/pdfen
dc.identifier.doihttps://doi.org/10.1016/j.dib.2020.106193en
dc.identifier.issn2352-3409en
dc.identifier.other106193en
dc.identifier.pmid32984453en
dc.identifier.urihttp://hdl.handle.net/10919/102210en
dc.identifier.volume32en
dc.language.isoenen
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en
dc.subjectNuclear Graphiteen
dc.subjectIG110, A3en
dc.subjectCrystallite edge areaen
dc.subjectXRD, Ramanen
dc.titleData analysis for characterization of IG110 and A3 by X-Ray diffraction and Raman spectroscopyen
dc.title.serialData in Briefen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten
dc.type.dcmitypeStillImageen

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