Electrical conduction transport mechanisms of barium titanate- based multilayer ceramic capacitors

Simple item page
dc.contributor.authorZhang, Tongen
dc.contributor.committeememberBurton, Larry C.en
dc.contributor.committeememberZallen, Richard H.en
dc.contributor.committeememberOnishi, Shinzoen
dc.contributor.departmentMaterials Engineeringen
dc.date.accessioned2014-03-14T21:37:43Zen
dc.date.adate2012-06-10en
dc.date.available2014-03-14T21:37:43Zen
dc.date.issued1988-08-15en
dc.date.rdate2012-06-10en
dc.date.sdate2012-06-10en
dc.description.abstractThe major objectives of this study were to examine electrical conduction properties of BaTiO3-based multilayer ceramic ( MLC ) capacitors in order to gain a better understanding of the conduction transport mechanisms inside the devices. The experiments involved mainly leakage current versus time measurements under both low temperature-low voltage stress and high temperature-high voltage stress. It was established that leakage current conduction in a MLC capacitor under temperature-voltage stress can be divided into three different conduction regions due to different mechanisms. Those regions are polarization current, DC conduction current and degradation current. The polarization current decreases with time as a power law relation, i.e. Ic(t) t-m where the exponent value m is strongly dependent on the type of capacitor and temperature, but is only weakly dependent on the applied voltage. It has been proposed that two degradation models ( a charge carrier concentration model and a reduction of grain boundary barrier height model ) can explain the degradation behavior for the Z5U devices tested. Degradation measurements indicate that the lifetime for Z5U capacitors can be described by Minford's expression. However, these models account only partly for X7R degradation. X7R behavior, is characterized by an early power law time dependence, followed by exponential voltage dependence. The most probable conduction transport mechanism in X7R capacitors is small polaron hopping, while grain boundary transmission may be the predominant conduction transport mechanism in Z5U capacitors.en
dc.description.degreeMaster of Scienceen
dc.format.extentx, 126 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-06102012-040412en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-06102012-040412/en
dc.identifier.urihttp://hdl.handle.net/10919/43074en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1988.Z534.pdfen
dc.relation.isformatofOCLC# 18959347en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1988.Z534en
dc.subject.lcshCeramic capacitorsen
dc.subject.lcshFerroelectricityen
dc.titleElectrical conduction transport mechanisms of barium titanate- based multilayer ceramic capacitorsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineMaterials Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
LD5655.V855_1988.Z534.pdf
Size:
4.71 MB
Format:
Adobe Portable Document Format
Description:
Download

Collections

Masters Theses