A novel approach to calculating relative scattering parameter sensitivity in computer-aided design programs

dc.contributor.authorBlackburn, Dane E.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2017-11-09T20:41:56Zen
dc.date.available2017-11-09T20:41:56Zen
dc.date.issued1988en
dc.description.abstractRelative sensitivity is a measure of the percentage change in a system parameter caused by a percentage change in a component parameter. The adjoint network method has previously been used by Monaco and Tiberio in the computation of relative scattering parameter sensitivity. A new approach is presented in this work which defines a bilinear equation and three constants that relate any component scattering parameter to any system scattering parameter. A computer-aided design program which implements this relative sensitivity in analysis and optimization is presented. Circuit analysis examples demonstrating sensitivity analysis and optimization are included. As a background for this work, computer-aided design concepts, such as network modeling, objective functions, Rosenbrock's optimization method, and the adjoint network method for estimating partial derivatives, are also presented.en
dc.description.degreeMaster of Scienceen
dc.format.extentiv, 118 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/80100en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 18605218en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1988.B544en
dc.subject.lcshComputer-aided designen
dc.subject.lcshMicrowave circuitsen
dc.titleA novel approach to calculating relative scattering parameter sensitivity in computer-aided design programsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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