Electrical characterization of thick film superconductors

dc.contributor.authorTurman, Christopher A.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:34:02Zen
dc.date.adate2009-04-18en
dc.date.available2014-03-14T21:34:02Zen
dc.date.issued1990en
dc.date.rdate2009-04-18en
dc.date.sdate2009-04-18en
dc.description.abstractWith the recent discovery of High T<sub>c</sub> ceramic superconducting materials, many potential applications which were considered impossible just a few years ago are now being realized. These new uses of superconductors will take place in electronics and energy systems where many different materials are used together. If these superconducting materials are to be used successfully, they must be characterized. Film quality was characterized by measuring the electrical properties under different conditions. Films were tested on alumina and magnesia substrates, to characterize the substrate interactions. Films were printed in different thicknesses and different widths, to determine the effect of film geometry on film quality. Finally these films were aged in a room ambient to determine the effect of atmospheric exposure. The results of these tests show that thick film Superconductors can be easily fabricated on magnesia substrates. Superconducting thick films can also be fabricated on alumina substrates, provided the film thickness is greater than 100μm and line width is greater than 50 mils. On either substrate material, critical currents of the films consistently decreased with thinner, narrower lines and environmental exposure. The maximum critical current on 2 magnesia substrates was 635 A/cm² for an unaged 77μm thick by 200 mil wide line, and the minimum was 345 A/cm² for a 25μm thick by 50 mil wide line aged for thirty days. Alumina substrates showed the same trend with a maximum of 75 A/cm² for an unaged 125μm thick by 200 mil wide line and a minimum of 47 A/cm² for a 100μm thick by 100 mil wide line aged for thirty days.en
dc.description.degreeMaster of Scienceen
dc.format.extentx, 78 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-04182009-041030en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-04182009-041030/en
dc.identifier.urihttp://hdl.handle.net/10919/42121en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1990.T876.pdfen
dc.relation.isformatofOCLC# 22293873en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1990.T876en
dc.subject.lcshSuperconductors -- Electric properties -- Researchen
dc.titleElectrical characterization of thick film superconductorsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

Files

Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
LD5655.V855_1990.T876.pdf
Size:
27.05 MB
Format:
Adobe Portable Document Format
Description:

Collections