A stochastic model of component failure mechanisms

dc.contributor.authorTran, Tramen
dc.contributor.departmentIndustrial Engineering and Operations Researchen
dc.date.accessioned2017-11-09T20:41:38Zen
dc.date.available2017-11-09T20:41:38Zen
dc.date.issued1987en
dc.description.abstractThe progress of a unimolecular chemical degradation reaction is used in representing a component failure mechanism. The component is said to fail when the concentration of reaction product accumulates beyond an acceptable level. The process of accumulating reaction product is modelled as a Markov pure birth process which, in turn, is used in developing the failure time distribution. The model is analyzed under the assumption that the reaction rate is constant. Also, the initial state and the final state of the degradation process are assumed to be Poisson variables. Based on numerical examples, it is found that the failure model can be described as a three-parameter or two-parameter Weibull distribution.en
dc.description.degreeMaster of Scienceen
dc.format.extentvii, 54 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/80057en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 17315314en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1987.T726en
dc.subject.lcshStochastic processesen
dc.subject.lcshMarkov processesen
dc.subject.lcshFailure time data analysisen
dc.titleA stochastic model of component failure mechanismsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineIndustrial Engineering and Operations Researchen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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