VTechWorks staff will be away for the Thanksgiving holiday beginning at noon on Wednesday, November 27, through Friday, November 29. We will resume normal operations on Monday, December 2. Thank you for your patience.
 

Extended Depth-of-focus in a Laser Scanning System Employing a Synthesized Difference-of-Gaussians Pupil

Files

ETD.pdf (1.03 MB)
Downloads: 116

TR Number

Date

1999-05-11

Journal Title

Journal ISSN

Volume Title

Publisher

Virginia Tech

Abstract

Traditional laser scanning systems, such as those used for microscopy, typically image objects of finite thickness. If the depth-of-focus of such systems is low, as is the case when a simple clear pupil is used, the object must be very thin or the image will be distorted. Several methods have been developed to deal with this problem. A microscope with a thin annular pupil has a very high depth-of-focus and can image the entire thickness of a sample, but most of the laser light is blocked, and the image shows poor contrast and high noise. In confocal laser microscopy, the depth-of-focus problem is eliminated by using a small aperture to discard information from all but one thin plane of the sample. However, such a system requires scanning passes at many different depths to yield an image of the entire thickness of the sample, which is a time-consuming process and is highly sensitive to registration errors.

In this thesis, a novel type of scanning system is considered. The sample is simultaneously scanned with a combination of two Gaussian laser beams of different widths and slightly different temporal frequencies. Information from scanning with the two beams is recorded with a photodetector, separated electronically, and processed to form an image. This image is similar to one formed by a system using a difference-of-Gaussians pupil, except no light has been blocked or wasted. Also, the entire sample can be scanned in one pass. The depth-of-focus characteristics of this synthesized difference-of-Gaussians pupil are examined and compared with those of well-known

Description

Keywords

extended depth of field, optical scanning microscopy, pupil synthesis

Citation

Collections