Extended Depth-of-focus in a Laser Scanning System Employing a Synthesized Difference-of-Gaussians Pupil
dc.contributor.author | Kourakos, Alexander William | en |
dc.contributor.committeechair | Poon, Ting-Chung | en |
dc.contributor.committeemember | Brown, Gary S. | en |
dc.contributor.committeemember | Indebetouw, Guy J. | en |
dc.contributor.department | Electrical and Computer Engineering | en |
dc.date.accessioned | 2014-03-14T20:38:01Z | en |
dc.date.adate | 1999-05-25 | en |
dc.date.available | 2014-03-14T20:38:01Z | en |
dc.date.issued | 1999-05-11 | en |
dc.date.rdate | 2000-05-25 | en |
dc.date.sdate | 1999-05-21 | en |
dc.description.abstract | Traditional laser scanning systems, such as those used for microscopy, typically image objects of finite thickness. If the depth-of-focus of such systems is low, as is the case when a simple clear pupil is used, the object must be very thin or the image will be distorted. Several methods have been developed to deal with this problem. A microscope with a thin annular pupil has a very high depth-of-focus and can image the entire thickness of a sample, but most of the laser light is blocked, and the image shows poor contrast and high noise. In confocal laser microscopy, the depth-of-focus problem is eliminated by using a small aperture to discard information from all but one thin plane of the sample. However, such a system requires scanning passes at many different depths to yield an image of the entire thickness of the sample, which is a time-consuming process and is highly sensitive to registration errors. In this thesis, a novel type of scanning system is considered. The sample is simultaneously scanned with a combination of two Gaussian laser beams of different widths and slightly different temporal frequencies. Information from scanning with the two beams is recorded with a photodetector, separated electronically, and processed to form an image. This image is similar to one formed by a system using a difference-of-Gaussians pupil, except no light has been blocked or wasted. Also, the entire sample can be scanned in one pass. The depth-of-focus characteristics of this synthesized difference-of-Gaussians pupil are examined and compared with those of well-known | en |
dc.description.degree | Master of Science | en |
dc.identifier.other | etd-052199-162314 | en |
dc.identifier.sourceurl | http://scholar.lib.vt.edu/theses/available/etd-052199-162314/ | en |
dc.identifier.uri | http://hdl.handle.net/10919/33091 | en |
dc.publisher | Virginia Tech | en |
dc.relation.haspart | ETD.pdf | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | extended depth of field | en |
dc.subject | optical scanning microscopy | en |
dc.subject | pupil synthesis | en |
dc.title | Extended Depth-of-focus in a Laser Scanning System Employing a Synthesized Difference-of-Gaussians Pupil | en |
dc.type | Thesis | en |
thesis.degree.discipline | Electrical and Computer Engineering | en |
thesis.degree.grantor | Virginia Polytechnic Institute and State University | en |
thesis.degree.level | masters | en |
thesis.degree.name | Master of Science | en |
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