On detection of stuck-open faults using stuck-at test sets in CMOS combinational circuits

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dc.contributor.authorLee, Hyung Kien
dc.contributor.committeechairHa, Dong Samen
dc.contributor.committeememberTront, Joseph G.en
dc.contributor.committeememberMidkiff, Scott F.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:37:46Zen
dc.date.adate2012-06-10en
dc.date.available2014-03-14T21:37:46Zen
dc.date.issued1989-03-15en
dc.date.rdate2012-06-10en
dc.date.sdate2012-06-10en
dc.description.abstractThe traditional line stuck-at fault model does not properly represent transistor stuck-open (SOP) faults in complementary metal oxide semiconductor (CMOS) circuits. In general, test generation methods for detecting CMOS SOP faults are complex and time consuming due to the sequential behavior of faulty circuits. The majority of integrated circuit manufacturers still rely on stuck-at test sets to test CMOS combinational circuits at the risk of some SOP faults not being detected. In this thesis we investigate two aspects regarding the detection of SOP faults using stuck-at test sets. First, we measure the SOP fault coverage of stuck-at test sets for various CMOS combinational circuits. The SOP fault coverage is compared with that of random pattern test sets. Second, we propose a method to improve the SOP fault coverage of stuck-at test sets by organizing the test sequences of stuck-at test sets. The performance of the proposed method is compared with those of competing methods. Experimental results show that the proposed method leads to smaller test sets and shorter processing time while achieving high SOP fault coverage.en
dc.description.degreeMaster of Scienceen
dc.format.extentvii, 75 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-06102012-040521en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-06102012-040521/en
dc.identifier.urihttp://hdl.handle.net/10919/43092en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V855_1989.L433.pdfen
dc.relation.isformatofOCLC# 19836506en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V855 1989.L433en
dc.subject.lcshMetal oxide semiconductors, Complementary -- Testingen
dc.titleOn detection of stuck-open faults using stuck-at test sets in CMOS combinational circuitsen
dc.typeThesisen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen

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